2009 Advanced Laboratories Conference Abstract Detail Page

Previous Page  |  New Search  |  Browse All

Abstract Title: Modern Interferometry B
Abstract: Available only to those who have taken the session Modern Interferometry A.

Participants will see, at level B, Applications of Interferometry:
  • how to make controlled and measurable sub-micron displacements of one mirror in the interferometer
  • how to process fringe signals electronically, and how to 'count fringes', in order to measure the wavelength of light directly with a micrometer
  • how to derive an experimentally-measured value of the wavelength of light.
Abstract Type: Workshop

Workshop Documents

Workshop Document: Download the Workshop Document
Session: Session V - Parallel Workshops

Author/Organizer Information

Primary Contact: Dr. Jonathan F. Reichert
TeachSpin, Inc.
Phone: 716.885.4701