2009 Advanced Laboratories Conference Abstract Detail Page

Previous Page  |  New Search  |  Browse All

Abstract Title: Introduction to Nanoscale Imaging with the Atomic Force Microscope
Abstract: Participants will learn the basics of operating an Atomic Force Microscope by imaging nanoscale particles in both contact mode and dynamic force mode. This will include an introduction to how the AFM scans the surface and interprets interactions into 3D images. Software to measure cross-sections of nanoparticles will be demonstrated as well as additional off-line analysis of data.
Abstract Type: Workshop

Workshop Documents

Workshop Document: Download the Workshop Document
Workshop Document (2): Download the Workshop Document (2)
Session: Session XI -  Parallel Workshops

Author/Organizer Information

Primary Contact: Mark R. Flowers
Nanoscience Instruments, Inc
Phone: 1-480-940-3940