A low-cost capacitance-based experiment to measure the doping density of a silicon sample is described. Our sample is a commercially produced Schottky diode. The phasesensitive detection required to measure the sample's capacitance is carried out using an inexpensive data acquisition (DAQ) device and a software program that implements the lock-in detection algorithm. We show experimental set-ups appropriate for two low-cost DAQ devices, where each set-up takes into account the limitations of each DAQ device (the USB-6009 device with restricted analog input and inadequate waveform generation capabilities; the myDAQ device with no hardware triggering). Excellent results for the sample's doping density and built-in potential are obtained from each set-up.
Presented at the 2013 AAPT Summer Meeting, W36: Advanced Labs Workshop.
Essick, J. (2013, July 9). Low-Cost Capacitance Profiling of a Semiconductor. Retrieved December 12, 2024, from https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471
Essick, John. Low-Cost Capacitance Profiling of a Semiconductor. July 9, 2013. https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471 (accessed 12 December 2024).
Essick, John. Low-Cost Capacitance Profiling of a Semiconductor. 9 July 2013. 12 Dec. 2024 <https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471>.
@misc{
Author = "John Essick",
Title = {Low-Cost Capacitance Profiling of a Semiconductor},
Volume = {2024},
Number = {12 December 2024},
Month = {July 9, 2013},
Year = {}
}
%A John Essick %T Low-Cost Capacitance Profiling of a Semiconductor %D July 9, 2013 %U https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471 %O application/pdf
%0 Electronic Source %A Essick, John %D July 9, 2013 %T Low-Cost Capacitance Profiling of a Semiconductor %V 2024 %N 12 December 2024 %8 July 9, 2013 %9 application/pdf %U https://www.compadre.org/Repository/document/ServeFile.cfm?ID=12912&DocID=3471
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