2018 BFY III Abstract Detail Page
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| Abstract Title: |
W34: Resistivity: 23 Orders of Magnitude on your desk, simplified Van Der Pauw & more |
| Abstract: |
The typical desktop environment is the enemy of precision measurements. Temperature gradients produce thermocouple errors, clothing carries electrostatic charge and generates EMFs, and 60/120 Hz noise blasts from lighting and power cables all around. Surface resistivity, a commonly sought after parameter for semiconductors and conductive polymers, also requires specialized probes and an expensive probing apparatus.
In this workshop, participants will make four typically-difficult measurements of resistivity (Extremely low resistivity, extremely high resistivity, surface resistivity of a polymer, and surface resistivity of a silicon wafer) without requiring any specialized shielding or apparatus, using Keithley Instruments products and techniques outlined in the ""Low Level Measurements Handbook - 7th edition (available online).
Also on display (and used as part of the surface resistivity measurements) will be Keithley Instruments' new line of low-cost Touch-Test-Invent Multimeters, demonstrating the advantages of students being able to visualize and analyze precision data from their experiments in real time. |
| Abstract Type: |
Workshop
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Author/Organizer Information |
| Primary Contact: |
Mark Zimmerman
Keithley Instruments
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