2015 BFY II Abstract Detail Page
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| Abstract Title: |
W52 - van der Pauw resistivity measurements on wafers, characterizing low resistance materials, and semiconductor characterization |
| Abstract: |
This workshop will take students through the measurement technology to enable them to characterize materials using resistance measurements for electrical characterization. The students will learn several techniques to measure resistivity, particularly low resistivity, for studies on materials. One technique is the van der Pauw measurement technique for measurements on thin samples such as semiconducting wafers. Van der Pauw measurements, in addition to quantifying material resistivity , are also the basis for Hall effect measurements which are used to determine carrier mobility in materials.
Specifically, research on semiconducting materials leads to new semiconductors and new semiconductor construction technologies. The technologist needs to understand how to characterize the performance of a device created using new and modified semiconductor materials.
The students will learn methodology for electrically characterizing the performance of a semiconductor device using curve tracing techniques with measurements and data presentation controlled by an Android tablet.
Students will be introduced to current sources, nanovoltmeters, and source-measurement instruments for making high sensitivity measurements. |
| Abstract Type: |
Workshop
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Author/Organizer Information |
| Primary Contact: |
James Niemann
Keithley Instruments, a Tektronix Company
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Co-Author(s)
and Co-Presenter(s) |
Mark Zimmerman, mark.zimmerman -at- keithley.com, Keithley Instruments
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