2015 BFY II Abstract Detail Page
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||W13 - Low-Cost Capacitance Profiling of a Semiconductor
||A low-cost capacitance-based experiment to accurately measure the doping density of a silicon sample will be presented. The sample is a commercially produced Schottky diode and the phase-sensitive detection required to measure the sample's capacitance is carried out using an inexpensive data acquisition (DAQ) device and a LabVIEW software program that implements the lock-in detection algorithm. An experimental set-up using the National Instruments (NI) myDAQ device, which has no hardware triggering, will be demonstrated during the workshop. Another possible setup using the NI USB-6009 device with restricted analog input and inadequate waveform generation capabilities and comparison to results with obtained using research-grade instrumentation will be discussed. Details of this experiment can be found in Am. J. Phys. 82, 196 (2014).
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