The purpose of this laboratory is to learn about and observe certain properties of a two-dimensional system. The system to be used is the inversion layer of a silicon MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor). By making conductance measurements in a magnetic field, Landau levels can be observed whose properties can be used, in conjunction with other information, to verify the two-dimensionality of the inversion layer and to derive some of the physical parameters of the MOSFET.
%0 Electronic Source %D March 13, 2010 %T Quantum Oscillations %E Hudek, Dean %V 2016 %N 26 October 2016 %8 March 13, 2010 %9 application/pdf %U http://www.compadre.org/Repository/document/ServeFile.cfm?ID=11370&DocID=2376
Disclaimer: ComPADRE offers citation styles as a guide only. We cannot offer interpretations about citations as this is an automated procedure. Please refer to the style manuals in the Citation Source Information area for clarifications.